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Springer Theses Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Ma, (Hardcover)

Springer Theses Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Ma, (Hardcover)


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Management number 251700433 Release Date 2026/09/26 List Price US$43.16 Model Number 251700433
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This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.

  • Springer Theses Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Ma, (Hardcover)
  • Author: Kipp Van Schooten
  • ISBN: 9783319005898
  • Format: Hardcover
  • Publication Date: 2013-07-30
  • Page Count: 90
Manual & guide type Instruction Manual
Book format Hardcover
Edition 2013 Edition
Pages 90
Language English
Brand Kipp Van Schooten
Pub date 20130730
Author Kipp Van Schooten
Subgenre Electronics
Genre Computing & Internet
Bisac subject heading Technology & Engineering
Series title Springer Theses
Number in series 0
Dimensions 6.00 x 0.50 x 9.20 in
Age group Adult
Piece count 0
Retail packaging Single Piece
Original languages English

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